IAD is pleased to present the book "Control Charts and Machine Learning for Anomaly Detection in Manufacturing" is edited by Assoc. Prof. Tran Kim Phuc.
The International Research Institute for Artificial Intelligence and Data Science (IAD) is pleased to present the book "Control Charts and Machine Learning for Anomaly Detection in Manufacturing" is edited by Senior Associate Professor Kim Phuc Tran, ENSAIT & GEMTEX, University of Lille, France; simultaneously, he is the Senior Scientific Advisor of Dong A University and IAD.
The book was inspired from the research direction of Anomaly Detection in Manufacturing directed by Senior Associate Professor Phuc since the early days of the IAD establishment, as well as with the contribution of Prof. Cédric Heuchenne, HEC, University of Liège, Belgium; simultaneously, he is the scientific advisor to IAD. Besides, IAD's members have had this research direction deployed from 2017 to present.
So in this book, there is a very special chapter contributed by members of IAD - Application of Machine Learning in Statistical Process Control Charts: A Survey and Perspective.
- In this chapter, the IAD authors presented a study examining advances in the application of machine learning in the stages of algorithm design, pattern recognition, and interpretation of anomaly detection results, and they suggest future research directions.
- Subsequent chapters are written by renowned and active researchers in the field. They are from universities in Europe and the US, such as UCLouvain, Helmut Schmidt University, University of Nantes, The National Engineering School of Tarbes, University of Padova, University of Florida, University of Central Florida, etc.
Besides, this book has been indexed in the Scopus database.
Readers can find out more information about the book at the website:
